Table of Contents

Reliability and Electromigration Degradation of GaAs MicrowaveMonolithic Integrated Circuits (A. Christou).

Simulation and Computer Models for Electromigration (P.Tang).

Temperature Dependencies on Electromigration (M. Pecht & P.Lall).

Electromigration and Related Failure Mechanisms in VLSIMetallizations (A. Christou & M. Peckerar).

Metallic Electromigration Phenomena (S. Krumbein).

Theoretical and Experimental Study of Electromigration (J.Zhao).

GaAs on Silicon Performance and Reliability (P. Panayotatos, etal.).

Electromigration and Stability of Multilayer Metal-SemiconductorSystems on GaAs (A. Christou).

Electrothermomigration Theory and Experiments in Aluminum Thin FilmMetallizations (A. Christou).

Reliable Metallization for VLSI (M. Peckerar).

Index.