Advanced Laser Diode Reliability

by Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda, Giovanna Mura

Overview

Advanced Laser Diode Reliability focuses on causes and effects of  degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.

Product Details

ISBN-13:	9781785481543
Publisher:	Elsevier Science
Publication date:	07/13/2021
Pages:	268
Product dimensions:	6.00(w) x 9.00(h) x (d)

About the Author

Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices

Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.

Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories.

Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.

Table of Contents

1. Laser Diode Reliability
2. Multi-Component Model for Semiconductor Laser Degradation
3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions
4. Laser Diode Characteristics
5. Laser Diode DC Measurement Protocols

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From the Publisher

Defines Failure Physics of Semiconductor Laser Diodes: modes and mechanisms. Device-level modelling for parameter extraction and measurement new protocols