Advanced Scanning Electron Microscopy and X-Ray Microanalysis / Edition 1

Advanced Scanning Electron Microscopy and X-Ray Microanalysis / Edition 1

by Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy
     
 

ISBN-10: 0306421402

ISBN-13: 9780306421402

Pub. Date: 03/31/1986

Publisher: Springer US

Product Details

ISBN-13:
9780306421402
Publisher:
Springer US
Publication date:
03/31/1986
Edition description:
1986
Pages:
454
Product dimensions:
6.40(w) x 9.30(h) x 1.30(d)

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