Advances in Imaging and Electron Physics: Part A

by Jay Theodore Cremer Jr. (Editor)

Overview

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. - Contributions from leading authorities - Informs and updates on all the latest developments in the field

Product Details

ISBN-13:	9780123978141
Publisher:	Elsevier Science & Technology Books
Publication date:	10/22/2012
Series:	Advances in Imaging and Electron Physics , #172
Sold by:	Barnes & Noble
Format:	eBook
Pages:	696
File size:	15 MB
Note:	This product may take a few minutes to download.

Table of Contents

- Introduction to Neutron and X-ray Optics Jay Theodore Cremer - Compound Refractive Lenses and Prisms Jay Theodore Cremer - Geometric Neutron and X-ray Optics – Aberrations Jay Theodore Cremer - X-ray Optics Jay Theodore Cremer - Neutron Optics Jay Theodore Cremer - X-ray and Neutron Optics Jay Theodore Cremer

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From the Publisher

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains