Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

by Peter W. Hawkes
     
 

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ISBN-10: 012381314X

ISBN-13: 9780123813145

Pub. Date: 08/15/2010

Publisher: Elsevier Science

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography,

Overview

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading international scholars and industry experts
• Discusses hot topic areas and presents current and future research trends
• Invaluable reference and guide for physicists, engineers and mathematicians

Product Details

ISBN-13:
9780123813145
Publisher:
Elsevier Science
Publication date:
08/15/2010
Series:
Advances in Imaging and Electron Physics Series
Pages:
248
Product dimensions:
6.00(w) x 9.00(h) x 0.70(d)

Table of Contents

  1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach
  2. LucaGeretti, AntonioAbramo

  3. Logarithmic Image Processing for Color Images
  4. M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

  5. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography
  6. Rainer A. Leitgeb

  7. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy
  8. S.A. Nepijko, G. Schönhense

  9. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging
  10. Chad M. Parish

  11. Aberration Correctors developed under Triple C Project
  12. Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

  13. Spatially resolved thermoluminescence in a scanning electron microscope

T. Schulz, M. Albrecht, K.Irmscher

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