Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

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Overview

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading international scholars and industry experts
• Discusses hot topic areas and presents current and future research trends
• Invaluable reference and guide for physicists, engineers and mathematicians

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Product Details

  • ISBN-13: 9780123813183
  • Publisher: Elsevier Science
  • Publication date: 3/23/2010
  • Pages: 304
  • Product dimensions: 6.20 (w) x 9.10 (h) x 0.80 (d)

Meet the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

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Table of Contents

  1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach
  2. LucaGeretti, AntonioAbramo

  3. Logarithmic Image Processing for Color Images
  4. M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

  5. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography
  6. Rainer A. Leitgeb

  7. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy
  8. S.A. Nepijko, G. Schönhense

  9. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging
  10. Chad M. Parish

  11. Aberration Correctors developed under Triple C Project
  12. Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

  13. Spatially resolved thermoluminescence in a scanning electron microscope

T. Schulz, M. Albrecht, K.Irmscher

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