Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

by Peter W. Hawkes
     
 

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ISBN-10: 0123813182

ISBN-13: 9780123813183

Pub. Date: 03/23/2010

Publisher: Elsevier Science

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image

Overview

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

Product Details

ISBN-13:
9780123813183
Publisher:
Elsevier Science
Publication date:
03/23/2010
Series:
Advances in Imaging and Electron Physics Series
Pages:
304
Product dimensions:
6.20(w) x 9.10(h) x 0.80(d)

Table of Contents

1. Charged particles in electromagnetic fields

2. Language of aberration expansions in charged particle optics

3. Transporting charged particle beams in static fields

4. Transporting charged particles in radiofrequency fields

5. Static magnetic charged particle analyzers

6. Electrostatic energy analyzers

7. Mass analyzers with combined electrostatic and magnetic fields

8. Time-of-flight mass analyzers

9. Radiofrequency mass analyzers

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