Advances in Imaging and Electron Physics

by Peter W. Hawkes (Editor)

Overview

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians

Product Details

ISBN-13:	9780123813138
Publisher:	Elsevier Science & Technology Books
Publication date:	11/02/2010
Series:	Advances in Imaging and Electron Physics , #164
Sold by:	Barnes & Noble
Format:	eBook
Pages:	392
File size:	13 MB
Note:	This product may take a few minutes to download.

About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

- Magnetolithography - from the Bottom-Up Route to High Throughput – Amos Bardea and Ron Naaman - The Optics of the Spatial Coherence Wavelets – Román Castañeda - Common Diffraction Integral Calculation Based on Fast Fourier Transform Algorithm – LI Junchang, WU Yanmei and LI Yan - A generalized approach to describe the interference contrast and the phase contrast method – Marcel Teschke and Stefan Sinzinger - Nonlinear partial differential equations for noise problems – Booyong Choi - Harmuth Corrigenda - Henning Harmuth

What People are Saying About This

From the Publisher

Volume 132 in this prestigeous series!

Editorial Reviews

The four surveys contained in this volume illustrate widely diverse aspects of imaging and electron physics. The first two chapters address applications of electron microscopy, including the role of this technique in mineralogy and a study of the high- resolution electron microscopy of quasicrystals. The latter is actually a short monograph presenting the underlying crystallography and explaining in detail how the corresponding images and diffraction patterns should be interpreted. The third contribution is an account of a new approach to deconvolution in image processing in which the author, by associating a polynomial with the gray-level values of (discrete) images, shows that it is possible to invert the convolutional relation that describes many kinds of image formation. The volume ends with a detailed discussion of the dual de Broglie wave, including a critical account of new developments in the debate over the existence and role of such a wave. Annotation c. by Book News, Inc., Portland, Or.

Booknews

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE

From the Publisher