Advances in X-Ray Analysis

Advances in X-Ray Analysis

by C.S. Barrett

ISBN-10: 0306442493

ISBN-13: 9780306442490

Pub. Date: 10/31/1992

Publisher: Springer-Verlag New York, LLC

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Springer-Verlag New York, LLC
Publication date:

Table of Contents

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

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