Advances in X-Ray Analysis: Volume 32 / Edition 1

Advances in X-Ray Analysis: Volume 32 / Edition 1

by Charles S. Barrett
     
 

ISBN-10: 0306432366

ISBN-13: 9780306432361

Pub. Date: 06/01/1989

Publisher: Springer US

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session

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Overview

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

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Product Details

ISBN-13:
9780306432361
Publisher:
Springer US
Publication date:
06/01/1989
Edition description:
1989
Pages:
682
Product dimensions:
7.01(w) x 10.00(h) x 0.28(d)

Table of Contents

I. High Brilliance Sources/Applications.- Synchrotron Radiation X-Ray Fluorescence Analysis.- X-Ray Diffraction Using Synchrotron Radiation — A Catalysis Perspective.- II. On-Line X-Ray Analysis.- On-Line X-Ray Fluorescence Spectrometer for Coating Thickness Measurements.- Process Control Applications of the Peltier Cooled SI(LI) Detector Based EDXRF Spectrometer.- Application of Fundamental Parameter Software to On-Line XRF Analysis.- On-Stream XRF Measuring System for Ore Slurry Analysis.- Applications of On-Line XRF and XRD Analysis Techniques to Industrial Process Control.- On-Site Tests of a New XRD/XRF On-Line Process Analyzer.- III. Xrf Mathematical Models and Quantitation.- Concepts of Influence Coefficients in XRF Analysis and Calibration.- Painless XRF Analysis Using New Generation Computer Programs.- Intensity and Distribution of Background X-Rays in a Wavelength-Dispersive Spectrometer. II. Applications.- What Can Data Analysis do for X-Ray Microfluorescence Analysis?.- The Determination of Rare Earth Elements in Geological Samples by XRF Using the Proportional Factor Method.- IV. Techniques And XRF Instrumentation.- How to Use the Features of Total Reflection of X-rays for Energy Dispersive XRF.- Applications of a Laboratory X-Ray Microprobe to Materials Analysis.- Development of Instrument Control Software for the SRS/300 Spectrometer on a VAX/730 Computer Running the VMS Operating System.- Instrumentation and Applications for Total Reflection X-Ray Fluorescence Spectrometry.- Micro X-Ray Fluorescence Analysis with Synchrotron Radiation.- X-Ray Microprobe Studies Using Multilayer Focussing Optics.- V. XRF Applications.- Resolution Enhancement for Cu K-alpha Emission of Y-Ba-Cu-O Compounds.- Chemical State Analysis by X-Ray Fluorescence Using Absorption Edges Shifts.- High Resolution X-Ray Fluorescence Si K? Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts.- Quantitative Analysis of Fluorine and Oxygen by X-Ray Fluorescence Spectrometry Using a Layered Structure Analyzer.- The Homogeneity of Fe, Sr and Zr in SL-3/Lake Sediment Standard Reference Material by Radioisotope Induced X-Ray Emission..- Quantitative Analysis of Arsenic Element in a Trace of Water Using Total Reflection X-Ray Fluorescence Spectrometry.- Impurity Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence Analysis.- Sample Treatment for TXRF — Requirements and Prospects.- Sample Preparation Optimization for EDXRF Analysis of Portland Cement.- The Viability of XRF Determination of Gold in Mineral Reconnaissance.- An Improved Fusion Technique for Major-Element Rock Analysis by XRF.- Modern Alloy Analysis and Identification with a Portable X-Ray Analyzer.- Low Level Iodine Detection by TXRF Spectrometry.- The Application of P-32 and Sn-113 Radionuclides for the Determination of Noble Metals.- Characterization of Permalloy Thin Films via Variable Sample Exit Angle Ultrasoft X-Ray Fluorescence Spectrometry.- VI. Analysis of Thin Films by XRD and XRF.- X-Ray Diffraction Analysis of High Tc Superconducting Thin Films.- Thickness Measurement of Epitaxical Thin Films by X-Ray Diffraction Method.- Texture Analysis of Thin Films and Surface Layers by Low Incidence Angle X-Ray Diffraction.- Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method.- X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins.- X-Ray Diffraction Studies of Polycrystalline Thin Films Using Glancing Angle Diffractometry.- Density Measurement of Thin Sputtered Carbon Films.- Determination of Ultra-Thin Carbon Coating Thickness by X-Ray Fluorescence Technique.- VII. X-Ray Stress Analysis.- Separation of the Macro- and Micro-Stresses in Plastically Deformed 1080 Steel.- Effect of Plastic Deformation on Oscillations in “d” vs. Sin2? Plots A FEM Analysis.- X-Ray Diffractometric Determination of Lattice Misfit Between— and—’ Phases in Ni-Base Superalloys — Conventional X-Ray Source vs. Synchrotron Radiation.- Standard Deviations in X-Ray Stress and Elastic Constants Due to Counting Statistics.- Elastic Constants of Alloys Measured with Neutron Diffraction.- Stress Measurements with a Two-Dimensional Real-Time System.- Application of a New Solid State X-Ray Camera to Stress Measurement.- Advantages of the Vector Method to Study the Texture of Well-Textured Thin Layers.- Taking into Account the Texture Effect in the Measurement of Residual Stresses by Using the Vector Method of Texture Analysis.- X-Ray Diffraction Studies on Shock-Modified Y Ba2Cu3O7 Superconductors.- The Characterization of a Solid Sorbent with Crystallite Size and Strain Data from X-Ray Diffraction Line Broadening.- X-Ray Measurement of Grinding Residual Stress in Alumina Ceramics.- Residual Stresses Near SCC Fracture Surfaces of AISI 4340 Steel.- Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method.- Residual Stresses in Al2CO3/SiC (Whisker) Composites Containing Interfacial Carbon Films.- VIII. Applications of Digitized XRD Patterns.- Parallel Beam and Focusing Powder Diffractometry.- Chemical Constraints in Quantitative X-Ray Powder Diffraction for Mineral Analysis of the Sand/Silt Fractions of Sedimentary Rocks.- The Crystal Structures of the Cubic and Tetragonal Phases of Y1Ba3Cu2O6.5 +—.- Using X-Ray Powder Diffraction to Determine the Structure of VPI-5 — A Molecular Sieve with the Largest Known Pores.- Optimizing the Calculation of Standardless Quantitative Analysis.- Shadow: A System for X-Ray Powder Diffraction Pattern Analysis.- IX. Qualitative and Quantitative Phase Analysis Diffraction Applications.- Specific Data Handling Techniques and New Enhancements in a Search/Match Program.- Use of the Crystal Data File on CD-ROM.- A Reference Database Retrieval System: Information as a Tool to Assist in XRD Phase Identification.- On the Selection of the Value for the Experimental Wavelength in Powder Diffraction Measurements.- Results of the JCPDS-ICDD Intensity Round Robin.- On the Preparation of Good Quality X-Ray Powder Patterns.- Semi-Quantitative XRD Analysis of Fly Ash Using Rutile as an Internal Standard.- Mechanically-Induced Phase Transformations in Plutonium Alloys.- The Determination of—-Cristobalite in Airborne Dust by X-Ray Diffraction — Theory and Practice.- Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals.- Comparison of Experimental Techniques to Improve Peak to Background Ratios in X-Ray Powder Diffractometry.- X-Ray Diffraction Studies of Solid Solutions of Pentaglycerine-Neopentylglycol.- Simultaneous Thermal and Structural Measurements of Oriented Polymers by DSC/XRD Using an Area Detector.- Vacuum Free-Fall Method for Preparation of Randomly Oriented XRD Samples.- X. X-Ray Tomography, Imaging, and Topography.- Applications of Dual-Energy X-Ray Computed Tomography to Structural Ceramics.- Microtomography Detector Design: It’s Not Just Resolution.- Required Corrections for Analysis of Industrial Samples with Medical CT Scanners.- LM-ACT for Imaging RAM Devices in X-Ray Diffraction Topographs.- Author Index.

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