Advances in X-Ray Analysis: Volume 32 / Edition 1

Hardcover (Print)
Buy New
Buy New from BN.com
$278.82
Used and New from Other Sellers
Used and New from Other Sellers
from $22.44
Usually ships in 1-2 business days
(Save 92%)
Other sellers (Hardcover)
  • All (9) from $22.44   
  • New (3) from $186.85   
  • Used (6) from $22.44   

Editorial Reviews

Booknews
Proceedings of the 37th Annual Conference, Aug. 1988, Steamboat Springs, Colo. Papers consider the following topics: high brilliance sources/applications; XRF mathematical models and quantification; XRF applications; analysis of thin films by XRD and XRF; x-ray stress analysis; digitized XRD patterns; qualitative and quantification phase analysis diffraction applications; x-ray tomography, imaging, and topography. Annotation c. Book News, Inc., Portland, OR (booknews.com)
Read More Show Less

Product Details

  • ISBN-13: 9780306432361
  • Publisher: Springer US
  • Publication date: 6/1/1989
  • Edition description: 1989
  • Edition number: 1
  • Pages: 681
  • Product dimensions: 1.56 (w) x 10.00 (h) x 7.00 (d)

Table of Contents

I. High Brilliance Sources/Applications.- Synchrotron Radiation X-Ray Fluorescence Analysis.- X-Ray Diffraction Using Synchrotron Radiation — A Catalysis Perspective.- II. On-Line X-Ray Analysis.- On-Line X-Ray Fluorescence Spectrometer for Coating Thickness Measurements.- Process Control Applications of the Peltier Cooled SI(LI) Detector Based EDXRF Spectrometer.- Application of Fundamental Parameter Software to On-Line XRF Analysis.- On-Stream XRF Measuring System for Ore Slurry Analysis.- Applications of On-Line XRF and XRD Analysis Techniques to Industrial Process Control.- On-Site Tests of a New XRD/XRF On-Line Process Analyzer.- III. Xrf Mathematical Models and Quantitation.- Concepts of Influence Coefficients in XRF Analysis and Calibration.- Painless XRF Analysis Using New Generation Computer Programs.- Intensity and Distribution of Background X-Rays in a Wavelength-Dispersive Spectrometer. II. Applications.- What Can Data Analysis do for X-Ray Microfluorescence Analysis?.- The Determination of Rare Earth Elements in Geological Samples by XRF Using the Proportional Factor Method.- IV. Techniques And XRF Instrumentation.- How to Use the Features of Total Reflection of X-rays for Energy Dispersive XRF.- Applications of a Laboratory X-Ray Microprobe to Materials Analysis.- Development of Instrument Control Software for the SRS/300 Spectrometer on a VAX/730 Computer Running the VMS Operating System.- Instrumentation and Applications for Total Reflection X-Ray Fluorescence Spectrometry.- Micro X-Ray Fluorescence Analysis with Synchrotron Radiation.- X-Ray Microprobe Studies Using Multilayer Focussing Optics.- V. XRF Applications.- Resolution Enhancement for Cu K-alpha Emission of Y-Ba-Cu-O Compounds.- Chemical State Analysis by X-Ray Fluorescence Using Absorption Edges Shifts.- High Resolution X-Ray Fluorescence Si K? Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts.- Quantitative Analysis of Fluorine and Oxygen by X-Ray Fluorescence Spectrometry Using a Layered Structure Analyzer.- The Homogeneity of Fe, Sr and Zr in SL-3/Lake Sediment Standard Reference Material by Radioisotope Induced X-Ray Emission..- Quantitative Analysis of Arsenic Element in a Trace of Water Using Total Reflection X-Ray Fluorescence Spectrometry.- Impurity Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence Analysis.- Sample Treatment for TXRF — Requirements and Prospects.- Sample Preparation Optimization for EDXRF Analysis of Portland Cement.- The Viability of XRF Determination of Gold in Mineral Reconnaissance.- An Improved Fusion Technique for Major-Element Rock Analysis by XRF.- Modern Alloy Analysis and Identification with a Portable X-Ray Analyzer.- Low Level Iodine Detection by TXRF Spectrometry.- The Application of P-32 and Sn-113 Radionuclides for the Determination of Noble Metals.- Characterization of Permalloy Thin Films via Variable Sample Exit Angle Ultrasoft X-Ray Fluorescence Spectrometry.- VI. Analysis of Thin Films by XRD and XRF.- X-Ray Diffraction Analysis of High Tc Superconducting Thin Films.- Thickness Measurement of Epitaxical Thin Films by X-Ray Diffraction Method.- Texture Analysis of Thin Films and Surface Layers by Low Incidence Angle X-Ray Diffraction.- Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method.- X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins.- X-Ray Diffraction Studies of Polycrystalline Thin Films Using Glancing Angle Diffractometry.- Density Measurement of Thin Sputtered Carbon Films.- Determination of Ultra-Thin Carbon Coating Thickness by X-Ray Fluorescence Technique.- VII. X-Ray Stress Analysis.- Separation of the Macro- and Micro-Stresses in Plastically Deformed 1080 Steel.- Effect of Plastic Deformation on Oscillations in “d” vs. Sin2? Plots A FEM Analysis.- X-Ray Diffractometric Determination of Lattice Misfit Between— and—’ Phases in Ni-Base Superalloys — Conventional X-Ray Source vs. Synchrotron Radiation.- Standard Deviations in X-Ray Stress and Elastic Constants Due to Counting Statistics.- Elastic Constants of Alloys Measured with Neutron Diffraction.- Stress Measurements with a Two-Dimensional Real-Time System.- Application of a New Solid State X-Ray Camera to Stress Measurement.- Advantages of the Vector Method to Study the Texture of Well-Textured Thin Layers.- Taking into Account the Texture Effect in the Measurement of Residual Stresses by Using the Vector Method of Texture Analysis.- X-Ray Diffraction Studies on Shock-Modified Y Ba2Cu3O7 Superconductors.- The Characterization of a Solid Sorbent with Crystallite Size and Strain Data from X-Ray Diffraction Line Broadening.- X-Ray Measurement of Grinding Residual Stress in Alumina Ceramics.- Residual Stresses Near SCC Fracture Surfaces of AISI 4340 Steel.- Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method.- Residual Stresses in Al2CO3/SiC (Whisker) Composites Containing Interfacial Carbon Films.- VIII. Applications of Digitized XRD Patterns.- Parallel Beam and Focusing Powder Diffractometry.- Chemical Constraints in Quantitative X-Ray Powder Diffraction for Mineral Analysis of the Sand/Silt Fractions of Sedimentary Rocks.- The Crystal Structures of the Cubic and Tetragonal Phases of Y1Ba3Cu2O6.5 +—.- Using X-Ray Powder Diffraction to Determine the Structure of VPI-5 — A Molecular Sieve with the Largest Known Pores.- Optimizing the Calculation of Standardless Quantitative Analysis.- Shadow: A System for X-Ray Powder Diffraction Pattern Analysis.- IX. Qualitative and Quantitative Phase Analysis Diffraction Applications.- Specific Data Handling Techniques and New Enhancements in a Search/Match Program.- Use of the Crystal Data File on CD-ROM.- A Reference Database Retrieval System: Information as a Tool to Assist in XRD Phase Identification.- On the Selection of the Value for the Experimental Wavelength in Powder Diffraction Measurements.- Results of the JCPDS-ICDD Intensity Round Robin.- On the Preparation of Good Quality X-Ray Powder Patterns.- Semi-Quantitative XRD Analysis of Fly Ash Using Rutile as an Internal Standard.- Mechanically-Induced Phase Transformations in Plutonium Alloys.- The Determination of—-Cristobalite in Airborne Dust by X-Ray Diffraction — Theory and Practice.- Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals.- Comparison of Experimental Techniques to Improve Peak to Background Ratios in X-Ray Powder Diffractometry.- X-Ray Diffraction Studies of Solid Solutions of Pentaglycerine-Neopentylglycol.- Simultaneous Thermal and Structural Measurements of Oriented Polymers by DSC/XRD Using an Area Detector.- Vacuum Free-Fall Method for Preparation of Randomly Oriented XRD Samples.- X. X-Ray Tomography, Imaging, and Topography.- Applications of Dual-Energy X-Ray Computed Tomography to Structural Ceramics.- Microtomography Detector Design: It’s Not Just Resolution.- Required Corrections for Analysis of Industrial Samples with Medical CT Scanners.- LM-ACT for Imaging RAM Devices in X-Ray Diffraction Topographs.- Author Index.

Read More Show Less

Customer Reviews

Be the first to write a review
( 0 )
Rating Distribution

5 Star

(0)

4 Star

(0)

3 Star

(0)

2 Star

(0)

1 Star

(0)

Your Rating:

Your Name: Create a Pen Name or

Barnes & Noble.com Review Rules

Our reader reviews allow you to share your comments on titles you liked, or didn't, with others. By submitting an online review, you are representing to Barnes & Noble.com that all information contained in your review is original and accurate in all respects, and that the submission of such content by you and the posting of such content by Barnes & Noble.com does not and will not violate the rights of any third party. Please follow the rules below to help ensure that your review can be posted.

Reviews by Our Customers Under the Age of 13

We highly value and respect everyone's opinion concerning the titles we offer. However, we cannot allow persons under the age of 13 to have accounts at BN.com or to post customer reviews. Please see our Terms of Use for more details.

What to exclude from your review:

Please do not write about reviews, commentary, or information posted on the product page. If you see any errors in the information on the product page, please send us an email.

Reviews should not contain any of the following:

  • - HTML tags, profanity, obscenities, vulgarities, or comments that defame anyone
  • - Time-sensitive information such as tour dates, signings, lectures, etc.
  • - Single-word reviews. Other people will read your review to discover why you liked or didn't like the title. Be descriptive.
  • - Comments focusing on the author or that may ruin the ending for others
  • - Phone numbers, addresses, URLs
  • - Pricing and availability information or alternative ordering information
  • - Advertisements or commercial solicitation

Reminder:

  • - By submitting a review, you grant to Barnes & Noble.com and its sublicensees the royalty-free, perpetual, irrevocable right and license to use the review in accordance with the Barnes & Noble.com Terms of Use.
  • - Barnes & Noble.com reserves the right not to post any review -- particularly those that do not follow the terms and conditions of these Rules. Barnes & Noble.com also reserves the right to remove any review at any time without notice.
  • - See Terms of Use for other conditions and disclaimers.
Search for Products You'd Like to Recommend

Recommend other products that relate to your review. Just search for them below and share!

Create a Pen Name

Your Pen Name is your unique identity on BN.com. It will appear on the reviews you write and other website activities. Your Pen Name cannot be edited, changed or deleted once submitted.

 
Your Pen Name can be any combination of alphanumeric characters (plus - and _), and must be at least two characters long.

Continue Anonymously

    If you find inappropriate content, please report it to Barnes & Noble
    Why is this product inappropriate?
    Comments (optional)