Advances in X-Ray Analysis: Volume 29 / Edition 1

by Charles S. Barrett, jerome B. Cohen, John Faber, Jr., Ron Jenkins, Donald E. Leyden

Overview

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

Product Details

ISBN-13:	9780306422874
Publisher:	Springer US
Publication date:	06/30/1986
Series:	Advances in X-Ray Analysis , #29
Edition description:	1986
Pages:	600
Product dimensions:	6.14(w) x 9.21(h) x 0.36(d)

Editorial Reviews

Proceedings of the 37th Annual Conference, Aug. 1988, Steamboat Springs, Colo. Papers consider the following topics: high brilliance sources/applications; XRF mathematical models and quantification; XRF applications; analysis of thin films by XRD and XRF; x-ray stress analysis; digitized XRD patterns; qualitative and quantification phase analysis diffraction applications; x-ray tomography, imaging, and topography. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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