Advances in X-Ray Analysis: Volume 38 / Edition 1

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Editorial Reviews

Booknews
**** The series is cited in Chen. Ninety-three papers from the August 1994 conference provide the latest research developments in such areas as accurate modeling of size and strain broadening in the Reitveld refinement--the "double-Voigt" approach; total electron yield (TEY), a new approach for quantitative x-ray analysis; development of bone-lead reference materials for validating in vivo XRF measurements; nondestructive characterization of multilayer thin films by x-ray reflectivity; and design of an x-ray fluorescence sensor for the cone penetrometer. Annotation c. Book News, Inc., Portland, OR (booknews.com)
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Product Details

  • ISBN-13: 9780306450457
  • Publisher: Springer US
  • Publication date: 9/30/1995
  • Edition description: 1995
  • Edition number: 1
  • Pages: 788
  • Product dimensions: 6.90 (w) x 9.70 (h) x 2.00 (d)

Table of Contents

Accurate Modeling of Size and Strain Broadening in the Rietveld Refinement: The 'DoubleVoigt' Approach (D. Balzar). In vivo Xray Fluorescence of Lead and Other Toxic Trace Elements (D.R. Chettle). Xray Diffraction Analysis of PM10 Aerosols Extracted by Ultrasound (B.L. Davis, H. Chen). Total Electron Yield (TEY): A New Approach for Quantitative Xray Analysis (H. Ebel). Manufacture and Use of Setting Up Samples (F.R. Feret). Applied Crystallography in the Scanning Electron Microscope Using a CCD Detector (R.P. Goehner, J.R. Michael). Trace Analysis by TXRF (R.S. Hockett). An in situ XRD Technique for Annealing Investigations (D.E. Hoylman, S.C. Axtell). Adaptation of the EGS4 Monte Carlo Code for the Design of a Polarized Source for Xray Fluorescence Analysis of Platinum and Other Heavy Metals in vivo (D.G. Lewis). 3D Graphing of XRF Matrix Correction Equations (A.J. Klimasara). Environmental Factors Contributing to the Body Burden of Lead as Determined by in vivo Xray Fluorescence (S.J.S. Ryde). Investigation of Residual Stresses in a Sleeve Coldworked Lug Specimen by Neutron and Xray Diffraction (R. Lin). Picosecond Xray Diffraction: System and Applications (P.M. Rentzepis). The Characterization of Microtexture by Orientation Mapping (R.A. Schwarzer). 79 additional articles. Index.

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