Advances in X-Ray Analysis: Volume 39 / Edition 1

Advances in X-Ray Analysis: Volume 39 / Edition 1

by John V. Gilfrich
     
 

ISBN-10: 0306458039

ISBN-13: 9780306458033

Pub. Date: 01/31/1998

Publisher: Springer US

Product Details

ISBN-13:
9780306458033
Publisher:
Springer US
Publication date:
01/31/1998
Edition description:
1998
Pages:
908
Product dimensions:
7.01(w) x 10.00(h) x 0.08(d)

Table of Contents

Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry; J.L. de Vries. Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction; M. Schuster, H. Gobel. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction; V. Hauk. Characterization of Polymers, Amorphous Materials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers; N.S. Murthy. Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples; V. Valvoda, et al. Characterization of Thin Films by X-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films; I.C. Noyan, C.C. Goldsmith. Other Applications of X-Ray Diffractions Including High-Temperature and Nonambient: Total Reflection XRF and Trace Analysis: Quantitative ZRF Data Interpretation and Other XRF Applications. 95 Additional Articles. Index.

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