Analysis of Sampled Imaging Systems

by Richard H. Vollmerhausen, Ronald G. Driggers

Overview

Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader.

Product Details

ISBN-13:	9780819434890
Publisher:	SPIE Press
Publication date:	04/28/2000
Series:	Tutorial Texts in Optical Engineering Series
Pages:	194
Product dimensions:	6.94(w) x 10.04(h) x 0.49(d)

Editorial Reviews

This tutorial shows design engineers and system analysts how to quantify the effect of sampling on imager performance. The authors use Fourier transform theory to describe and quantify sampling artifacts like display raster, blocky images, and the loss or alteration of image detail due to aliasing. The theory is then used to predict the type and level of sampling artifacts expected for a particular sensor and display combinations. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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