Atom Probe Field Ion Microscopy

Atom Probe Field Ion Microscopy

by Michael Kenneth Miller, G. D. Smith, A. Cerezo, M. G. Hetherington
     
 

ISBN-10: 0198513879

ISBN-13: 9780198513872

Pub. Date: 10/01/1996

Publisher: Oxford University Press, USA

The atom probe technique permits the imaging and chemical identification of individual and solid surfaces. It is one of the most important experimental methods in the emerging field of atomic-scale science and technology. This book gives a definitive and up-to-date account of the field, and is written by leading authorities on the subject. It includes recent

Overview

The atom probe technique permits the imaging and chemical identification of individual and solid surfaces. It is one of the most important experimental methods in the emerging field of atomic-scale science and technology. This book gives a definitive and up-to-date account of the field, and is written by leading authorities on the subject. It includes recent advances in the method which have allowed for new and exciting applications to emerge in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

Product Details

ISBN-13:
9780198513872
Publisher:
Oxford University Press, USA
Publication date:
10/01/1996
Series:
Monographs on the Physics and Chemistry of Materials Series, #52
Pages:
532
Product dimensions:
6.38(w) x 9.50(h) x 1.29(d)

Table of Contents

1. Historical background and general introduction
2. Physical principles of field ion microscopy
3. FIM image interpretation and application
4. Physical principles of atom probe interpretation
5. Statistical analysis of atom probe data
6. Metallurgical applications
7. Atom probe studies of non-metallic materials, then films and surface phenomena

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