Atomic and Nuclear Analytical Methods: XRF, M�ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques
This book compares and offers a comprehensive overview of nine analytical techniques important in material science and many other branches of science. All these methods are already well adapted to applications in diverse fields such as medical, environmental studies, archaeology, and materials science. This clearly presented reference describes and compares the principles of the methods and the various source and detector types.

1129869781
Atomic and Nuclear Analytical Methods: XRF, M�ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques
This book compares and offers a comprehensive overview of nine analytical techniques important in material science and many other branches of science. All these methods are already well adapted to applications in diverse fields such as medical, environmental studies, archaeology, and materials science. This clearly presented reference describes and compares the principles of the methods and the various source and detector types.

299.99 In Stock
Atomic and Nuclear Analytical Methods: XRF, M�ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

Atomic and Nuclear Analytical Methods: XRF, M�ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

by Hem Raj Verma
Atomic and Nuclear Analytical Methods: XRF, M�ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

Atomic and Nuclear Analytical Methods: XRF, M�ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

by Hem Raj Verma

Hardcover(2007)

$299.99 
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Overview

This book compares and offers a comprehensive overview of nine analytical techniques important in material science and many other branches of science. All these methods are already well adapted to applications in diverse fields such as medical, environmental studies, archaeology, and materials science. This clearly presented reference describes and compares the principles of the methods and the various source and detector types.


Product Details

ISBN-13: 9783540302773
Publisher: Springer Berlin Heidelberg
Publication date: 06/11/2007
Edition description: 2007
Pages: 376
Product dimensions: 6.10(w) x 9.25(h) x 0.04(d)

Table of Contents

X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE).- Rutherford Backscattering Spectroscopy.- Elastic Recoil Detection.- Mössbauer Spectroscopy (MS).- X-Ray Photoelectron Spectroscopy.- Neutron Activation Analysis.- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission.- Accelerator Mass Spectrometry (AMS).
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