Atomic Force Microscopy

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Overview


Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.
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Editorial Reviews

From the Publisher

"As a frequent AFM user, I've been often asked, 'is there a book you recommend for students who are new to AFM techniques?' For a long time there wasn't, but now there's Atomic Force Microscopy. One of the book's main strengths is that it is relatively short...it might be the upper limit of what students are willing to handle...a great introduction to AFMs for beginners and also serves as a good starting point for more serious users." -- Udo D. Schwarz, Yale University

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Product Details

  • ISBN-13: 9780199570454
  • Publisher: Oxford University Press, USA
  • Publication date: 5/20/2010
  • Edition description: New Edition
  • Pages: 288
  • Product dimensions: 6.60 (w) x 9.80 (h) x 0.70 (d)

Meet the Author

Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM.

Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.

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Table of Contents

Preface vii

Introduction 1

1.1 Background to AFM 2

1.2 AFM today 6

2 AFM instrumentation 9

2.1 Basic concepts in AFM instrumentation 9

2.2 The AFM stage 13

2.3 AFM electronics 27

2.4 Acquisition software 33

2.5 AFM cantilevers and probes 36

2.6 AFM instrument environment 45

2.7 Scanning environment 46

3 AFM modes 49

3.1 Topographic modes 49

3.2 Non-topographic modes 64

3.3 Surface modification 78

4 Measuring AFM images 82

4.1 Sample preparation for AFM 82

4.2 Measuring AFM images in contact mode 87

4.3 Measuring AFM images in oscillating modes 96

4.4 High-resolution imaging 100

4.5 Force curves 101

5 AFM image processing and analysis 103

5.1 Processing AFM images 104

5.2 Displaying AFM images 110

5.3 Analysing AFM images 114

6 AFM image artefacts 121

6.1 Probe artefacts 121

6.2 Scanner artefacts 126

6.3 Image processing artefacts 131

6.4 Vibration noise 133

6.5 Noise from other sources 133

6.6 Other artefacts 135

7 Applications of AFM 139

7.1 AFM applications in physical and materials sciences 139

7.2 AFM applications in nanotechnology 151

7.3 Biological applications of AFM 160

7.4 Industrial AFM applications 177

Appendix A AFM standards 184

Appendix B Scanner calibration and certification procedures 192

Appendix C Third party AFM software 198

Bibliography 201

Index 241

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