Bias Temperature Instability for Devices and Circuits
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
1115566210
Bias Temperature Instability for Devices and Circuits
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
109.0
In Stock
5
1
Bias Temperature Instability for Devices and Circuits
810
Bias Temperature Instability for Devices and Circuits
810
109.0
In Stock
Product Details
| ISBN-13: | 9781461479093 |
|---|---|
| Publisher: | Springer-Verlag New York, LLC |
| Publication date: | 10/22/2013 |
| Sold by: | Barnes & Noble |
| Format: | eBook |
| Pages: | 810 |
| File size: | 17 MB |
| Note: | This product may take a few minutes to download. |
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