Characterization of Wide Bandgap Power Semiconductor Devices

by Fei Wang, Zheyu Zhang, Edward A. Jones

Overview

At the heart of modern power electronics converters are power semiconductor switching devices. The emergence of wide bandgap (WBG) semiconductor devices, including silicon carbide and gallium nitride, promises power electronics converters with higher efficiency, smaller size, lighter weight, and lower cost than converters using the established silicon-based devices. However, WBG devices pose new challenges for converter design and require more careful characterization, in particular due to their fast switching speed and more stringent need for protection.

Characterization of Wide Bandgap Power Semiconductor Devices presents comprehensive methods with examples for the characterization of this important class of power devices. After an introduction, the book covers pulsed static characterization; junction capacitance characterization; fundamentals of dynamic characterization; gate drive for dynamic characterization; layout design and parasitic management; protection design for double pulse test; measurement and data processing for dynamic characterization; cross-talk consideration; impact of three-phase system; and topology considerations.

Product Details

ISBN-13:	9781785614910
Publisher:	The Institution of Engineering and Technology
Publication date:	10/31/2018
Series:	Energy Engineering
Pages:	347
Product dimensions:	6.14(w) x 9.21(h) x (d)

About the Author

Fei (Fred) Wang is Professor of Electrical Engineering and Condra Chair of Excellence in Power Electronics, and Technical Director of NSF/DOE Engineering Research Center CURENT at The Universityof Tennessee, Knoxville, USA. He also holds a joint appointment with Oak Ridge National Lab. Prof. Wang has published over 400 journal and conference papers, authored 3 book chapters, and holds 15 US patents. He is a fellow of IEEE and NAI.

Zheyu Zhang is a Lead Power Electronics Engineer with General Electric Global Research. He was a Research Assistant Professor at the Universityof Tennessee, Knoxville from 2015 to 2018. He has published over 60 papers in the most prestigious journals and conference proceedings, four patent applications with one licensed, and two IEEE tutorial seminars. He was the recipient of two IEEE prize paper awards.

Edward A. Jones is a Senior Applications Engineer with Efficient Power Conversion Corporation. He completed his Ph.D. at The Universityof Tennessee, where he was a Chancellor's Fellow, a CURENT Fellow, and a Bredesen Energy Sciences and Engineering Fellow. He has published over 20 peer-reviewed IEEE papers, an IEEE tutorial seminar, and a patent.

Table of Contents

• Chapter 1: Introduction
• Chapter 2: Pulsed static characterization
• Chapter 3: Junction capacitance characterization
• Chapter 4: Fundamentals of dynamic characterization
• Chapter 5: Gate drive for dynamic characterization
• Chapter 6: Layout design and parasitic management
• Chapter 7: Protection design for double pulse test
• Chapter 8: Measurement and data processing for dynamic characterization
• Chapter 9: Cross-talk consideration
• Chapter 10: Impact of three-phase system
• Chapter 11: Topology consideration
• Appendix A: Recommended equipment and components list for DPT setup
• Appendix B: Data processing code for dynamic characterization