CMOS Electronics: How It Works, How It Fails / Edition 1

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Overview

CMOS manufacturing environments are rife with symptoms that can indicate serious test, design, or reliability problems. CMOS Electronics: How It Works, How It Fails provides both practitioners and students in the industry with the electronic knowledge that relates not just to the design of a product, but other important aspects of manufacturing such as testing, reliability, failure analysis, yield-quality issues, and common problems that may occur during production.
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Editorial Reviews

From the Publisher
"...an essential text for practitioners in the CMOS industry or for students headed there…" (IEEE Solid-State Circuits Society Newsletter, October 2004)
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Product Details

  • ISBN-13: 9780471476696
  • Publisher: Wiley, John & Sons, Incorporated
  • Publication date: 4/28/2004
  • Edition description: New Edition
  • Edition number: 1
  • Pages: 368
  • Product dimensions: 7.26 (w) x 9.80 (h) x 0.99 (d)

Meet the Author

JAUME SEGURA, PhD, is an Associate Professor of Electrical Engineering at the Balearic Islands University, Spain, where he has been a member of the faculty since 1993. He has been a visiting researcher at Philips Semiconductors and Intel Corporation, working on design and test issues. He is a member of the IEEE, the Chairman of the IEEE-CAS Spanish Chapter, and serves on the technical program committees of such conferences as ITC, DATE, and VTS.

CHARLES F. HAWKINS, PhD, is a Professor of Electrical Engineering at the University of New Mexico at Albuquerque, where he has been a member of the faculty since 1972. He is also a research contract engineer with the Sandia National Laboratories IC Group and has consulted with Intel Corporation, AMD Corporation, and Philips Research Labs on issues of quality, reliability, testability research, and testing. Professor Hawkins is a Member of IEEE and a member of the Electronic Device Failure Analysis Society (EDFAS) of ASM, as well as the editor of EDFAS Magazine. Professor Hawkins frequently teaches short courses and industrial seminars to leading chip manufacturers worldwide.

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Table of Contents

Foreword
Preface
Pt. I CMOS Fundamentals
1 Electrical Circuit Analysis 3
2 Semiconductor Physics 37
3 MOSFET Transistors 53
4 CMOS Basic Gates 99
5 CMOS Basic Circuits 127
Pt. II Failure Modes, Defects, and Testing of CMOS ICs
6 Failure Mechanisms in CMOS IC Materials 153
7 Bridging Defects 199
8 Open Defects 223
9 Parametric Failures 243
10 Defect-Based Testing 281
App. A: Solutions to Self-Exercises 331
Index 339
About the Authors 347
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