Compact Modeling: Principles, Techniques and Applications

by Gennady Gildenblat (Editor)

Overview

Most of the recent texts on compact modeling are limited to a particular class of semiconductor devices and do not provide comprehensive coverage of the field. Having a single comprehensive reference for the compact models of most commonly used semiconductor devices (both active and passive) represents a significant advantage for the reader. Indeed, several kinds of semiconductor devices are routinely encountered in a single IC design or in a single modeling support group. Compact Modeling includes mostly the material that after several years of IC design applications has been found both theoretically sound and practically significant. Assigning the individual chapters to the groups responsible for the definitive work on the subject assures the highest possible degree of expertise on each of the covered models.

Product Details

ISBN-13:	9789048186136
Publisher:	Springer Netherlands
Publication date:	06/30/2010
Edition description:	2010
Pages:	527
Product dimensions:	6.10(w) x 9.25(h) x 0.05(d)

Table of Contents

Compact Models of MOS Transistors.- Surface-Potential-Based Compact Model of Bulk MOSFET.- PSP-SOI: A Surface-Potential-Based Compact Model of SOI MOSFETs.- Benchmark Tests for MOSFET Compact Models.- High-Voltage MOSFET Modeling.- Physics of Noise Performance of Nanoscale Bulk MOS Transistors.- Compact Models of Bipolar Junction Transistors.- to Bipolar Transistor Modeling.- Mextram.- The HiCuM Bipolar Transistor Model.- Compact Models of Passive Devices.- Integrated Resistor Modeling.- The JUNCAP2 Model for Junction Diodes.- Surface-Potential-Based MOS Varactor Model.- Modeling of On-chip RF Passive Components.- Modeling of Multiple Gate MOSFETs.- Multi-Gate MOSFET Compact Model BSIM-MG.- Compact Modeling of Double-Gate and Nanowire MOSFETs.- Statistical Modeling.- Modeling of MOS Matching.- Statistical Modeling Using Backward Propagation of Variance (BPV).

Editorial Reviews

From the reviews:

“This excellent reference covers a niche in the recent development of compact modeling for integrated circuit systems. The book can serve as a guide to current research based on the down-scaling of semiconductor devices, particularly for device physicists, electrical engineers and applied mathematicians. The reader will benefit in particular from the coverage of statistical modeling, which treats shastic system variability and other random effects … . Each chapter is well documented with references, and the underlying theory for each device class is well demonstrated.” (Axel Mainzer Koenig, Optics & Photonics News, May, 2011)

From the Publisher