Defect and Microstructure Analysis by Diffraction

by Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge

Overview

Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials. Diffraction analysis is typically based on idealized crystals. The impurities and irregularities that work themselves into virtually all crystal structures, however, cause diffraction peak profiles to broaden and sometimes become asymmetric, making the data difficult to interpret. More powerful methods are undoing this effect, using the discrepancies themselves to describe microstructure of the material with unprecedented accuracy. These techniques in turn play a key role in many of the evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis. This book provides a comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. It lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this research is to extract all of the information locked in the powder diffraction pattern including the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in a specimen.

Product Details

ISBN-13:	9780198501893
Publisher:	International Union of Crystallography
Publication date:	03/16/2000
Series:	International Union of Crystallography Monographs on Crystallography , #10
Edition description:	New Edition
Pages:	808
Product dimensions:	9.21(w) x 6.14(h) x 1.69(d)

About the Author

The Ohio State University

Central Research Institute Skoda

Technical University of Clausthal

Table of Contents

List of contributorsAbbreviations1. Introduction to defect and microstructure analysis or the analysis of real structure, Jaroslav Fiala and Robert L. SnyderPart I. Fundamentals of defect analysis by diffraction2. Some applications of the kinematical theory of X-ray diffraction, Hans Bradaczek3. Profile fitting and analytical functions, Stefano Enzo and Liliana Schiffini4. Effects of instrument function, crystallite size, and strain on reflection profiles, V. Honkimäki and P. Suortti5. Use of pattern decomposition or simulation to study microstructure: theoretical considerations, J. Ian Langford6. Classical treatment of line profiles influenced by strain, small size, and stacking faults, C. R. Houska and R. Kuzel7. Voigt function model in diffraction-line broadening analysis, Davor Balzar8. X-ray analysis of precipitation-related crystals with dislocation substructure, R. I. Barabash9. Analytic functions describing line profiles influenced by size distribution, strain, and stacking faults, C. R. Houska and R. Kuzel10. The dislocation-based model of strain broadening in X-ray line profile analysis, T. Ungár11 Diffraction-line broadening analysis of dislocation configurations, A. C. Vermeulen et al.12 Diffraction-line broadening analysis of strain fields in crystalline solids, J. G. M. van Berkum et al.13. Paracrystallinity, Hans Bradaczek14. The model of the paracrystal and its application to polymers, W. Wilke15. Effect of planar defects in crystals on the position of powder diffraction lines, A. I. Ustinov16. Effect of stacking disorder on the profile of the powder diffraction line, Z. Weiss and P. CapkováPart II. Experimental techniques17. Crystallite statistics and accuracy in powder diffraction intensity measurements, Deane K. Smith18. Reciprocal space mapping and ultra-high resolution diffraction of polycrystalline materials, Paul F. Fewster and Norman L. AndrewPart III. Macrostress19. X-Ray analysis of the inhomogenous stress state, I. Kraus and N. GanevPart IV. Texture20. Texture and structure of polycrystals, Hans J. Bunge21. Texture effects in powder diffraction and their correction by simple empirical functions, V. ValvodaPart V. Whole-pattern fitting22. Accounting for size and microstrain in whole-powder pattern fitting, A. Le Bail23. Modelling of texture in whole-pattern fitting, Matti Järvinen24. A new whole-powder pattern-fitting approach, P. Scardi25. The role of whole-pattern databases in materials science, Deane K. SmithPart VI. Restoring physical patterns from the observed variables26. Restoration and preprocessing of physical profiles from measured data, Marian Cernansky27. Towards higher resolution: a mathematical approach, Derk ReefmanPart VII. Applications28. Use of pattern decomposition to study microstructure: practical aspects and applications, Daniel Louër29. X-ray diffraction broadening effects in materials characterization, Giora Kimmel and David Dayan30. Crystal size and distortion parameters in fibres using Wide-Angle X-ray Scattering (WAXS), R. Somashekar31. Pressure-induced profile change of energy-dispersive diffraction using synchrotron radiation, Takamitsu YamanakaIndex