Design, Analysis and Test of Logic Circuits Under Uncertainty / Edition 1

by Smita Krishnaswamy, Igor L. Markov, John P. Hayes

Overview

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design—-one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Product Details

ISBN-13:	9789048196432
Publisher:	Springer Netherlands
Publication date:	09/21/2012
Series:	Lecture Notes in Electrical Engineering , #115
Edition description:	2013
Pages:	124
Product dimensions:	6.10(w) x 9.25(h) x 0.02(d)

Table of Contents

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.