Design, Analysis and Test of Logic Circuits Under Uncertainty / Edition 1

Design, Analysis and Test of Logic Circuits Under Uncertainty / Edition 1

by Smita Krishnaswamy, Igor L. Markov, John P. Hayes
     
 

ISBN-10: 9048196434

ISBN-13: 9789048196432

Pub. Date: 09/21/2012

Publisher: Springer Netherlands

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC

Overview

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design—-one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Product Details

ISBN-13:
9789048196432
Publisher:
Springer Netherlands
Publication date:
09/21/2012
Series:
Lecture Notes in Electrical Engineering Series, #115
Edition description:
2013
Pages:
124
Product dimensions:
6.10(w) x 9.25(h) x 0.02(d)

Table of Contents

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.

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