Design for Reliability / Edition 1

by Dana Crowe, Alec Feinberg

Overview

Today's marketplace demands product reliability. At the same time, it places ever-increasing demands on products that push the limits of their performance and their functional life, and it does so with the expectation of lower per-unit product costs. To meet these demands, product design now requires a focused, streamlined, concurrent engineering process that will produce a product at the lowest possible cost in the least amount of time.

Design for Reliability provides a systematic approach to the design process that is sharply focused on reliability and firmly based on the physics of failure. It imparts an understanding of how, why, and when to use the wide variety of reliability engineering tools available and offers fundamental insight into the total design cycle. Applicable from the idea phase of the product development cycle through product obsolescence, Design for Reliability (DfR) concepts integrated with reliability verification and analytical physics form a coherent stage gate/phase design process that helps ensure that a product will meet customers' reliability objectives.

Whether you are a high-volume manufacturer of consumer items or a low volume producer of military commodities, your goal is the same: to bring a product to market using a process focused on designing out or mitigating potential failure modes prior to production release. Readers of Design for Reliability will learn to meet that goal and move beyond solidifying a basic offering to the marketplace to creating a true competitive advantage.

Product Details

ISBN-13:	9780849311116
Publisher:	Taylor & Francis
Publication date:	04/30/2001
Series:	Electronics Handbook Series , #11
Edition description:	New Edition
Pages:	256
Product dimensions:	8.62(w) x 10.88(h) x (d)

About the Author

Crowe, Dana; Feinberg, Alec

Table of Contents

THE STAGE GATE PROCESS. Reliability Science. Understanding Customer Requirements. Design Assessment Reliability Testing. Design Maturity Testing (DMT). Screening and Monitoring. SUPPORTING STAGE GATE. Semiconductor Process Reliability. Analytical Physics. TOPICS IN RELIABILITY. Reliability Statistics Simplified. Concepts in Accelerated Testing. Accelerated Reliability Growth. Reliability Predictive Modeling. Failure Modes and Effects Analysis. Evaluating Product Risk. Thermodynamic Reliability Engineering.

Editorial Reviews

"This book is definitely a strong addition to the body of knowledge for Reliability professionals and for any company that wants to improve the business competitiveness by improving product reliability…I have been fortunate to know [the DfR activity at M/A-COM/Tyco] and I also know how impressed other organizations are when they get to see it. This is an outstanding industry leader that has documented the implemented practice in this book."
—James E. "Gene" Bridgers, RESULTS MA

"…a practical and useful book…description of the 'stage gate approach'…emphasis on accelerated test methods…description of physics of failure and failure investigation techniques…"
Patrick O'Connor, author of Practical Reliability Engineering in Quality & Reliability Engineering, 2001

From the Publisher

Engineers at the M/A-COM Tyco Electronics revise the company's manual of the same title, which explains to engineers and managers how the design for reliability approach can enhance the concurrent design cycles. They argue that the stage gate process provides the maximum level of benefit to the design while minimizing the cycle time impact to that process, producing the highest levels of product reliability possible. The topics include understanding customer requirement, screening and monitoring, semiconductor process reliability, analytical physics, concepts in accelerated testing, and evaluating product risk. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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