Digital Speckle Pattern Interferometry and Related Techniques

by Pramod K. Rastogi (Editor)

Overview

Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry.

Product Details

ISBN-13:	9780471490524
Publisher:	Wiley
Publication date:	02/08/2001
Pages:	384
Product dimensions:	6.30(w) x 9.76(h) x 1.10(d)

About the Author

Pramod K. Rastogi is the author of Digital Speckle Pattern Interferometry and Related Techniques, published by Wiley.

Table of Contents

Contributors.

Foreword.

Preface and Introduction.

Speckle Statistics in the Context of Digital Speckle Interferometry (M. Lehmann).

Automated Analysis of Speckle Interferograms (J. Huntley).

Measurement of Static Surface Displacements, Derivatives of Displacements, and Three-dimensional Surface Shapes — Examples of Applications to Non-destructive Testing (P. Rastogi).

Dynamic Measurments (A. Moore, et al.).

Digital Speckle Photography (M. Sjödahl).

Digital Holographic Interferometry (G. Pedrini H. Tiziani).

Index.

Editorial Reviews

"this book is a welcome addition to the speckle pattern interferometry literature. The book is an excellent value for any graduate student, application engineer, research laboratory and group working in this field. Reading this book is a very enjoyable experience and it is worth every penny of its price." (Jnl of Optics & Lasers in Engineering, 2001)

"European physicists and engineers discuss a class of whole-field interferometeric techniques...primarily a reference for scientists and engineers…but can also serve as a self-study tutorial or a text..." (SciTech Book News, Vol. 25, No. 4, December 2001)

"…a systematic, up-to-date review of this rapidly progressing field…" (Optics & Photonics News, March 2003)

From the Publisher