EDA for IC System Design, Verification, and Testing

by Louis Scheffer (Editor), Luciano Lavagno (Editor), Grant Martin (Editor)

Overview

Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.

Product Details

ISBN-13:	9781351837590
Publisher:	CRC Press
Publication date:	10/03/2018
Series:	Electronic Design Automation for Integrated Circuits Hdbk
Sold by:	Barnes & Noble
Format:	eBook
Pages:	544
File size:	14 MB
Note:	This product may take a few minutes to download.

About the Author

Louis Scheffer, Luciano Lavagno, Grant Martin

Table of Contents

Introduction. The IC Design Process and EDA. Tools and Methodologies for System-Level Design. System-level specification and modeling languages. SoC Block Based Design and IP Assembly. Performance Evaluation Methods for MPSoC Design. Processor Modeling and Design Tools. Embedded Software Modeling and Design. Using Performance Metrics to Select Microprocessor Cores for IC Designs. Parallelizing High-Level Synthesis: A Code Transformational Approach to High-Level Synthesis. Cycle-Accurate System-Level Modeling and Performance Evaluation. Micro-Architectural Power Estimation and Optimization. Design Planning. Design and Verification Languages. Digital Simulation. Using Transactional Level Models in a SoC Design Flow. Assertion-based verification. Hardware Acceleration and Emulation. Formal Property Verification. Design for Test. Automatic Test Pattern Generation. Analog and Mixed-Signal Test.