Efficient Test Methodologies for High-Speed Serial Links

by Dongwoo Hong, Kwang-Ting Cheng

Overview

Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

Product Details

ISBN-13:	9789400730946
Publisher:	Springer Netherlands
Publication date:	02/25/2012
Series:	Lecture Notes in Electrical Engineering , #51
Edition description:	2010
Pages:	98
Product dimensions:	6.10(w) x 9.25(h) x 0.01(d)

Table of Contents

An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.