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Electron Backscatter Diffraction In Materials Science

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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about ...
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Overview

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then the growth of sales worldwide has been dramatic.

This has accompanied widening applicability in materials science problems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming TEM or X-ray diffraction investigations.

The purpose of this book is to provide the fundamental basis for EBSD. The formation and interpretation of EBSD patterns and the gnomonic projection are described as the framework for materials characterization using EBSD. Traditional representation of texture in orientation space is discussed in terms of stereographic projections, pole figures, inverse pole figures, and orientation distribution functions before introducing the Rodrigues-Frank representation of crystallographic texture. The fundamentals of automated EBSD and the accuracy of EBSD measurements are then discussed. Current hardware and software as well as future prospects foranalyzing EBSD data sets are reviewed. A brief mention of the criterion required for the purchase of an EBSD system is included as an aid to this relatively new area of materials characterization. The section concludes with chapters from three manufacturers of EBSD equipment that highlight recent advances in capabilities.

The book concludes with a review of recent applications of the technique to solve difficult problems in materials science as well as demonstrates the usefulness of coupling EBSD with other approaches such as numerical analysis, plasticity modeling, and TEM. Attention is paid to the measurement and mapping of strain using EBSD as well as the characterization of deformed microstructures, continuous recrystallization, analysis of facets, ceramics, and superconducting materials.

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Editorial Reviews

Booknews
Provides the fundamental basis for electron backscatter diffraction (EBSD), briefly covers the crystallography required for application, discusses the latest hardware and software available, and describes specific applications of EBSD. Chapter topics include representations of texture in orientation space, automated EBSD, phase identification using EBSD, and three-dimensional orientation imaging. Other topics are buying a system, strategies for analyzing EBSD datasets, use of EBSD data in mesoscale numerical analyses, characterization of deformed microstructures, and continuous recrystallization and grain boundaries in a superplastic aluminum alloy. Schwartz is affiliated with Lawrence Livermore National Laboratory. Annotation c. Book News, Inc., Portland, OR (booknews.com)
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Product Details

  • ISBN-13: 9780306464874
  • Publisher: Springer-Verlag New York, LLC
  • Publication date: 10/1/2008
  • Pages: 360
  • Product dimensions: 7.20 (w) x 10.20 (h) x 1.00 (d)

Table of Contents

1 The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy 1
2 Theoretical Framework for Electron Backscatter Diffraction 2
3 Representations of Texture in Orientation Space 31
4 Rodrigues-Frank Representations of Crystallographic Texture 39
5 Fundamentals of Automated EBSD 51
6 Studies on the Accuracy of Electron Backscatter Diffraction Measurements 65
7 Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope 75
8 Three-Dimensional Orientation Imaging 91
9 Automated Electron Backscatter Diffraction: Present State and Prospects 105
10 EBSD: Buying A System 123
11 Hardware and Software Optimization for Orientation Mapping and Phase Identification 127
12 An Automated EBSD Acquistion and Processing System 135
13 Advanced Software Capabilities for Automated EBSD 141
14 Strategies for Analyzing EBSD Datasets 153
15 Structure-Property Relations: EBSD-Based Material-Sensitive Design 171
16 Use of EBSD Data In Mesoscale Numerical Analyses 181
17 Characterization of Deformed Microstructures 199
18 Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium 213
19 Measuring Strains Using Electron Backscatter Diffraction 231
20 Mapping Residual Plastic Strain in Materials Using Electron Backscatter Diffraction 247
21 EBSD Contra Tem Characterization of a Deformed Aluminum Single Crystal 265
22 Continuous Recrystallization and Grain Boundaries in a Superplastic Aluminum Alloy 277
23 Analysis of Facets and Other Surfaces Using Electron Backscatter Diffraction 291
24 EBSD of Ceramic Materials 299
25 Grain Boundary Character Based Design of Polycrystalline High Temperature Superconducting Wires 319
Index 337
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