Electrostatic Discharge in Electronicsby William D. Greason
All the relevant and essential information regarding semiconductor device damage caused as a direct consequence of electrostatically induced overvoltages is contained in this concise reference. Along with presenting the basic principles of the main charge generation procedures and development of fundamental models for the discharge event, in-depth treatment is given to such topics as latent failures, indirect damage, measurement principles and the status of test standards. Includes an updated review of the technical literature published in the field of ESD.
- Taylor & Francis, Inc.
- Publication date:
- Electronic and Electrical Engineering Research Studies
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