Evolution of Thin Film Morphology: Modeling and Simulations

by Matthew Pelliccione, Toh-Ming Lu

Overview

The morphology and microstructure of thin films directly controls their optical, magnetic, and electrical properties, which are often significantly different from bulk material properties. Precise control of morphology and microstructure during thin film growth is paramount to producing the desired film quality for specific applications. To date, many thin film deposition techniques have been employed for manufacturing.

Product Details

ISBN-13:	9781441925800
Publisher:	Springer New York
Publication date:	11/19/2010
Series:	Springer Series in Materials Science , #108
Edition description:	Softcover reprint of hardcover 1st ed. 2008
Pages:	206
Product dimensions:	6.10(w) x 9.25(h) x 0.02(d)

Table of Contents

Description of Thin Film Morphology.- Surface Statistics.- Self-Affine Surfaces.- Mounded Surfaces.- Continuum Surface Growth Models.- Shastic Growth Equations.- Small World Growth Model.- Discrete Surface Growth Models.- Monte Carlo Simulations.- Solid-on-Solid Models.- Ballistic Aggregation Models.- Concluding Remarks.