Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined.
Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. A graphical representation based on trend lines is introduced to support a requirement based product development process.
The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap.
Flash Memories offers an opportunity to enhance your understanding of product development key topics such as:
· Reliability optimization of flash memories is all about threshold voltage margin understanding and definition;
· Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window;
· Technical characteristics are translated into quantitative performance indicators;
· Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution; · Cost, density, performance and durability values are combined into a common factor – performance indicator - which fulfills the application requirements
Cell, array, performance and reliability effects of flash memories are introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memory model is developed and a set of performance indicators characterizing architecture, cost and durability is defined.
Flash memories are selected to apply the Performance Indicator Methodology to quantify design and technology innovation. A graphical representation based on trend lines is introduced to support a requirement based product development process.
The Performance Indicator methodology is applied to demonstrate the importance of hidden memory parameters for a successful product and system development roadmap.
Flash Memories offers an opportunity to enhance your understanding of product development key topics such as:
· Reliability optimization of flash memories is all about threshold voltage margin understanding and definition;
· Product performance parameter are analyzed in-depth in all aspects in relation to the threshold voltage operation window;
· Technical characteristics are translated into quantitative performance indicators;
· Performance indicators are applied to identify and quantify product and technology innovation within adjacent areas to fulfill the application requirements with an overall cost optimized solution; · Cost, density, performance and durability values are combined into a common factor – performance indicator - which fulfills the application requirements

Flash Memories: Economic Principles of Performance, Cost and Reliability Optimization
268
Flash Memories: Economic Principles of Performance, Cost and Reliability Optimization
268Product Details
ISBN-13: | 9789400760813 |
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Publisher: | Springer Netherlands |
Publication date: | 09/13/2013 |
Series: | Springer Series in Advanced Microelectronics , #40 |
Edition description: | 2014 |
Pages: | 268 |
Product dimensions: | 6.10(w) x 9.25(h) x 0.03(d) |