Fundamental Principles of Engineering Nanometrology

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Overview

Fundamental Principles of Engineering Nanometrology

By: Richard K. Leach

Richard Leach demystifies the principles and techniques of nanometrology and introduces readers to the standards, equipment and analytical methods that together unlock the industrial and research potential of nanotechnology.

KEY FEATURES

  • Demystifies nanometrology for a wide audience of engineers, scientists and students involved in nanotech and advanced manufacturing applications and research.
  • Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty.
  • Fully updated to cover the latest technological developments, and standards / regulations.

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturingpossible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology applications and research. He also provides a route-map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques.

The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met.

Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy (including DLS, NTA), recent developments in interferometry and advances in co-ordinate metrology.

ABOUT THE AUTHOR

Professor Richard Leach is a principle Research Scientist in the Mass & Dimensional Group, Engineering Measurement Division at the National Physical Laboratory (NPL), UK.

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Regina Luttge, Microfabrication for Industrial Applications (Sept 2011), 9780815515821, Hardback, 296pp, $220.

Waqar Ahmed & M.J. Jackson, Emerging Nanotechnologies for Manufacturing (Sept 2009), 9780815515838, Hardback, 412pp, $210

Klapetek, Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology (Nov 2012), 9781455730582, Hardback, 336pp, $199.

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Product Details

  • ISBN-13: 9780080964546
  • Publisher: Elsevier Science
  • Publication date: 9/25/2009
  • Series: Micro and Nano Technologies Series
  • Pages: 352
  • Product dimensions: 7.50 (w) x 9.40 (h) x 0.90 (d)

Meet the Author

Richard Leach is a Principal Research Scientist in the Mass & Dimensional Group, Industry & Innovati
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Table of Contents

1. Introduction to metrology for micro- and nanotechnology

2. Some basics of measurement

3. Precision measurement instrumentation - some design principles

4. Length traceability using interferometry

5. Displacement measurement

6. Surface topography measurement instrumentation

7. Scanning probe and particle beam microscopy

8. Surface topography characterization

9. Co-ordinate metrology

10. Mass and force measurement

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