Handbook of Monochromatic XPS Spectra: The Elements of Native Oxides

by B. Vincent Crist

Overview

These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other materials.

• Offers a clear presentation of spectra with the rightamount of experimental detail.
• All of the experiments have been conducted under controlled conditions on the same instrument by aworld-renowned expert.

Product Details

ISBN-13:	9780471492658
Publisher:	Wiley
Publication date:	10/19/2000
Pages:	560
Product dimensions:	8.90(w) x 8.40(h) x 1.30(d)

About the Author

B. Vincent Crist is the author of Handbook of Monochromatic XPS Spectra: The Elements of Native Oxides, published by Wiley.

Table of Contents

ORGANIZATION AND DETAILS OF SPECTRAL SETS.

Alphabetical Organization of Spectra.

Contents of Each Set of Spectra.

Philosophy of Data Collection Methods.

Peak-Fitting (Curve-Fitting) of High Energy Resolution Spectra.

Charge Compensation of Insulating Materials.

Abbreviations Used.

INSTRUMENT AND ANALYSIS DETAILS USED TO MAKE XPS DATA.

Instrument Details.

Experimental Details.

Data Processing Details.

Sample Details.

Energy Resolution Details.

Energy Scale Reference Energies and Calibration Details.

Electron Counting and Instrument Response Function Details.

Effects of Poorly Focusing the Distance between the Sample and the Electron Lens.

Quantitation Details and Choice of 'Sensitivity Exponents'.

Crude Tests of the Reliability of Relative Sensitivity Factors.

Traceability Details.

Reference Papers Describing the Capabilities of X-Probe, M-Probe, and S-Probe XPS Systems.

Editorial Reviews

"...a very good practical reference source." (IEEE Electrical Insulation Magazine, Vol. 19, No. 4, July-August 2003)

From the Publisher

Intended for scientists in industry, academia, and government laboratories who use XPS spectra in materials and surface science, this handbook contains wide-scan spectra and narrow-scan spectra from the elements and native oxides of the elements. The elements have been analyzed under conditions that have maximized the accuracy of the binding energies. The introductory section includes comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details, and transmission function are all reported. The format is horizontal (10.5x8.5<">) to display the charts and graphs. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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