High Resolution X-Ray Diffractometry And Topography

by D.K. Bowen, Brian K. Tanner

Overview

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization

Product Details

ISBN-13:	9781135478605
Publisher:	CRC Press
Publication date:	02/05/1998
Sold by:	Barnes & Noble
Format:	eBook
Pages:	252
File size:	7 MB

About the Author

D. Keith Bowen, formerly Professor of Engineering at the University of Warwick, is President of Bede Scientific Inc., Denver, Colorado, USA, as well as Strategic Research Director of Bede Scientific Instruments Ltd. Brian K. Tanner is Professor of Physics and Head of the Department of Physics at the University of Durham, and Science Director of Bede Scientific Instruments Ltd., Durham.

Table of Contents

Preface, 1. Introduction: Diffraction Studies of Crystal Perfection, 2. High Resolution X-ray Diffraction Techniques, 3. Analysis of Epitaxial Layers, 4. X-ray Scattering Theory, 5. Simulation of X-ray Diffraction Rocking Curves, 6. Analysis of Thin Films and Multiple Layers, 7. Triple-axis X-ray Diffractometry, 8. Single-crystal X-ray Topography, 9. Double-crystal X-ray Topography, 10. Synchrotron Radiation Topography, Index

Editorial Reviews

Describes the latest techniques in X-ray diffraction used in research, development, and production, and provides theoretical and practical background for applying these techniques in scientific and industrial materials characterization. Combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data, with chapters on high resolution techniques, X-ray scattering theory, thin films and multiple layers, triple-axis X-ray diffractometry, and synchrotron radiation topography. Annotation c. by Book News, Inc., Portland, Or.

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