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Images of Materials / Edition 1
     

Images of Materials / Edition 1

by David B. Williams, Alan R. Pelton, Ronald Gronsky
 

ISBN-10: 0195058569

ISBN-13: 9780195058567

Pub. Date: 01/09/1992

Publisher: Oxford University Press, USA

This spectacularly illustrated book celebrates the structural beauty of everyday materials and the space-age technologies used to probe their surface features and internal structures. It introduces the reader to the various instruments and their uses: scanning electron, ion, and tunneling microscopies, acoustic microscopy and transmission electron microscopy.

Overview

This spectacularly illustrated book celebrates the structural beauty of everyday materials and the space-age technologies used to probe their surface features and internal structures. It introduces the reader to the various instruments and their uses: scanning electron, ion, and tunneling microscopies, acoustic microscopy and transmission electron microscopy. The book describes how images are processed and analyzed, and how modern materials science is based on these techniques and their ability to "see" materials at the atomic level. The book includes hundreds of illustrations and 32 pages of beautiful color plates depicting the complex microscopic realm within such everyday materials as the metals used in cars and planes, polymer fabrics, ceramics, and the ubiquitous silicon semiconductors, without which society today would fall into disarray and confusion. The many full-color and black-and-white illustrations make this book a pleasure for the eye, in addition to being a useful resource for scientists, students, researchers, and engineers involved in solid-state physics, materials science, geology, and chemistry.

Product Details

ISBN-13:
9780195058567
Publisher:
Oxford University Press, USA
Publication date:
01/09/1992
Pages:
432
Product dimensions:
8.88(w) x 11.38(h) x 1.25(d)

Table of Contents

1. Imaging by Light Optical Microscopy, G.F. Vander Voort
2. Scanning Electron Microscopy, D.C. Joy and J.I. Goldstein
3. Analytical Imaging With A Scanning Ion Microprobe, R. Levi-Setti et al.
4. Acoustic Microscopy, G.A.D. Briggs and M. Hoppe
5. Transmission Electron Microscopy, G. Thomas
6. Electron Diffraction Images, D.B. Williams and K.S. Vecchio
7. Atomic Resolution Microscopy, R. Gronsky
8. Surface Imaging by Scanning Tunneling Microscopy, S. Chiang and R.J. Wilson
9. Atom Probe Field-Ion Microscopy: Imaging at the Atomic Level, M.K. Miller and M.G. Burke
10. Compositional Mapping of the Microstructure of Materials, D.E. Newbury et al.
11. Processing Images and Selecting Regions of Interest, D.S. Bright et al.
12. Image Analysis of the Microstructure of Materials, J.C. Russ

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