Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics / Edition 2

Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics / Edition 2

by Theodore G. Rochow, Paul A. Tucker
     
 

The authors have completely revised and updated their work to account for new technologies and techniques.See more details below

Overview

The authors have completely revised and updated their work to account for new technologies and techniques.

Product Details

ISBN-13:
9780306446849
Publisher:
Springer US
Publication date:
07/01/1994
Series:
Language of Science Series
Edition description:
2nd ed. 1994
Pages:
480
Product dimensions:
1.19(w) x 6.00(h) x 9.00(d)

Table of Contents

A Brief History of Microscopy. Definitions, Attributes Contributing to Visibility, and General Principles. Simple and Compound Light Microscopes. Compound Microscopes Using Reflected Light. Microscopy with Polarized Light. The Microcopical Properties of Fibers and Plastics. Microscopical Properties of Crystals. Light Microcopy by Confocal Scanning. Micrograph. Contrast. Interference Microscopy. Microscopical Stages. Fourier Transform Infrared Microscopy. Transmission Electron Microscopy and Electron Diffraction. Scanning Electron Microscopy and Compositional Analysis. Emission Microscopies. XRay Microscopy. Acoustic Microscopy. Image Collection, Analysis, and Reconstruction by Computer. Preparation of Specimens. Index.

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