Introduction to Optical Metrology

by Rajpal S. Sirohi

Overview

Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text:

• Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy
• Describes the different principles used to measure the refractive indices of solids, liquids, and gases
• Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length
• Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements
• Depicts a wave propagating in the positive z-direction by e^{i(ωt – kz)}, as opposed to e^{i(kz – ωt)}

Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

Product Details

ISBN-13:	9781482236101
Publisher:	Taylor & Francis
Publication date:	08/20/2015
Series:	Optical Sciences and Applications of Light
Pages:	449
Product dimensions:	6.12(w) x 9.19(h) x (d)

About the Author

Rajpal S. Sirohi, Ph.D, is currently chair professor of the Physics Department at Tezpur University, India, and senior editor of Optical Engineering. Previously, he was director of the Indian Institute of Technology Delhi; vice-chancellor of Barkatullah University, Bhopal; vice-chancellor of Shobhit University, Meerut; and vice-chancellor of Amity University, Jaipur. He also served in various capacities at the Indian Institute of Science, Bangalore; Indian Institute of Technology Madras, Chennai; Case Western Reserve University, Cleveland, Ohio, USA; Rose-Hulman Institute of Technology, Terre Haute, Indiana, USA; Institute for Advanced Studies, University of Malaya, Malaysia; University of Namibia; National University of Singapore; and École Polytechnique Fédérale de Lausanne, Switzerland. Widely published and highly decorated, Professor Sirohi is or has been a fellow, honorary fellow, invited fellow, member, board member, and former president of numerous scientific academies, associations, committees, societies, and journals.

Table of Contents

Introduction to Optics. Laser Beams. Sources, Detectors, and Recording Media. Interferometry. Techniques. Measurement of Refractive Index. Measurement of Radius of Curvature and Focal Length. Optical Testing. Angle Measurement. Thickness Measurement. Measurement of Velocity. Pressure Measurement. Fiber Optic- and MEM-Based Measurements. Length Measurement.

Editorial Reviews

"A good book for students and professionals to learn both basic and practical aspects of optical metrology."
—Mitsuo Takeda, Center for Optical Research and Education, Utsunomiya University, Japan

"The theory and practice of optical metrology is equally weighted in this book, an ideal combination for the instructor, student, and researcher."
—Ramen Bahuguna, San Jose State University, California, USA

"The author’s way of writing/explaining is very well adapted to students and practical-thinking persons. The didactics show the long experience of the author."
—W. Osten, University Stuttgart, Germany

From the Publisher