Introduction To Scanning Transmission Electron Microscopy

Introduction To Scanning Transmission Electron Microscopy

by Dr Robert Keyse, Anthony J. Garratt-Reed, P.J. Goodhew, Prof Gordon Lorimer
     
 

STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

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Overview

STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Product Details

ISBN-13:
9781859960660
Publisher:
Taylor & Francis
Publication date:
12/01/1997
Series:
Microscopy Handbook Series
Pages:
128
Product dimensions:
6.14(w) x 9.21(h) x 0.27(d)

Table of Contents

Abbreviations
Preface
1Why STEM? - STEM versus TEM1
2STEM optics11
3The specimen27
4Imaging in the STEM37
5Diffraction in the STEM55
6Microanalysis in the STEM69
7Mapping in the STEM91
8Limits to STEM and advanced STEM97
App. A: Glossary105
App. B: Further reading109
Index111

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