Introduction to X-Ray Powder Diffractometry / Edition 1by Ron Jenkins, Robert Snyder
Pub. Date: 07/12/1996
When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range… See more details below
When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry.
- Publication date:
- Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications Series, #158
- Edition description:
- New Edition
- Product dimensions:
- 6.30(w) x 9.19(h) x 1.03(d)
Table of Contents
Characteristics of X-Radiation.
The Crystalline State.
Sources for the Generation of X-Radiation.
Detectors and Detection Electronics.
Production of Monochromatic Radiation.
Instruments for the Measurement of Powder Patterns.
Alignment and Maintenance of Powder Diffractometers.
Acquisition of Diffraction Data.
Reduction of Data from Automated Powder Diffractometers.
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I hate this it is not even a lot of pages just 1