Legacy Data: A Structured Methodology for Device Migration in DSM Technology / Edition 1

Legacy Data: A Structured Methodology for Device Migration in DSM Technology / Edition 1

by Pallab Chatterjee
     
 

ISBN-10: 1402073046

ISBN-13: 9781402073045

Pub. Date: 12/31/2002

Publisher: Springer US

This unique book deals with the migration of existing hard IP from one technology to another, using repeatable procedures. It will allow CAD practitioners to quickly develop methodologies that capitalize on the large volumes of legacy data available within a company today.

Overview

This unique book deals with the migration of existing hard IP from one technology to another, using repeatable procedures. It will allow CAD practitioners to quickly develop methodologies that capitalize on the large volumes of legacy data available within a company today.

Product Details

ISBN-13:
9781402073045
Publisher:
Springer US
Publication date:
12/31/2002
Edition description:
2003
Pages:
132
Product dimensions:
6.10(w) x 9.25(h) x 0.01(d)

Table of Contents

Foreword. Acknowledgements. Glossary. 1. Introduction. 2. Legacy Data. 2.1. Modem SOC Flow. 2.2. Legacy Data Review. 3. Reasons for Data Migration. 3.1. Functional Reuse in Derivative Products. 4. New Rules for DSM Flows. 4.1. Device Geometries. 4.2. Wafer Type. 4.3. Isolation Technique. 4.4. Operating Voltage. 4.5. Process Design Rules. 4.6. Device Performance. 4.7. Interconnect Options. 4.8. Memory Techniques. 4.9. OPC Masking Techniques. 5. Structured Methodology. 5.1. Assumptions for Migration. 5.2. Flowchart of Methodology. 5.3. Sequence of the Methodology. 6. Screening Criteria for Blocks. 6.1. Introduction of Case Study. 6.2. Block Selection. 6.3. Description of Selection Criteria. 7. Process Compatibility. 7.1.Process Migration Tradeoffs. 7.2. Sample USB Block Tradeoff Analysis. 8. Test Bench Requirements. 8.1. Test Bench Minimum Requirements. 8.2. Digital Test Bench. 8.3. Device Level Test Bench. 8.4. USB Sample Summary. 9. Block Identification. 9.1. Physical and Design Views. 9.2. Multiple View Correction. 9.3. Hierarchy Tree. 9.4. Test Circuits, Clocks and Power Grids. 10. Design Retargeting. 10.1 Device Level ReDesign Stages. 10.2. Re-Engineering Process: Device Level Design. 10.3. Re-Engineering Process: Corner Based Design. 10.4. Summary for USB Block Migration. 11. Design Validation. 11.1. Types of Validation. 11.2. Case Study Validation Summary. 12. Physical Design Migration. 12.1. Physical Migration Options. 13. Post Layout Validation. 13.1 Design Rule Checking: DRC. 13.2 Layout vs. Schematic: LVS. 13.3. Power Analysis: IR Drop. 13.4. Noise Analysis and Coupling: Signal Integrity. 13.5. RC Extraction for STA and for Device Stimulation. 13.6. Case Study Summary for Physical Verification. 14. Full Chip Verification. 14.1 Abstracts Required. Bibliography. Index.

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