Materials Characterization: Introduction to Microscopic and Spectroscopic Methods / Edition 1

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Overview

"This work is an illustrated introduction to modern characterization techniques, enabling users to understand the composition and structure of materials. Encompassing not just material structure but also chemical analysis, Materials Characterization covers all key structural and functional materials from metals and semiconductors to polymers and ceramics." Materials Characterization is an introductory book ideal for scientists and engineers embarking on material-related research and development. It is also an essential tool for advanced undergraduate and postgraduate students taking a first course on the topic.
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Product Details

  • ISBN-13: 9780470822982
  • Publisher: Wiley, John & Sons, Incorporated
  • Publication date: 6/2/2008
  • Edition description: Older Edition
  • Edition number: 1
  • Pages: 384
  • Product dimensions: 6.70 (w) x 9.80 (h) x 1.00 (d)

Meet the Author

Yang Leng is Professor, specialized in materials science and engineering, at The Hong Kong University of Science and Technology (HKUST). His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has extensively published in international journals. In addition, he has actively engaged in industrial consultancy. His contribution to teaching materials science and engineering is exemplified by the Teaching Excellence Appreciation award from the HKUST.

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Table of Contents

1 Light Microscopy 1

1.1 Optical Principles 1

1.2 Instrumentation 8

1.3 Specimen Preparation 15

1.4 Imaging Modes 25

1.5 Confocal Microscopy 38

2 X-ray Diffraction Methods 45

2.1 X-ray Radiation 45

2.2 Theoretical Background of Diffraction 49

2.3 X-ray Diffractometry 58

2.4 Wide Angle X-ray Diffraction and Scattering 71

3 Transmission Electron Microscopy 79

3.1 Instrumentation 79

3.2 Specimen Preparation 86

3.3 Image Modes 89

3.4 Selected Area Diffraction 101

3.5 Images of Crystal Defects 111

4 Scanning Electron Microscopy 121

4.1 Instrumentation 121

4.2 Contrast Formation 129

4.3 Operational Variables 134

4.4 Specimen Preparation 138

5 Scanning Probe Microscopy 145

5.1 Instrumentation 145

5.2 Scanning Tunneling Microscopy 148

5.3 Atomic Force Microscopy 152

5.4 Image Artifacts 165

6 X-ray Spectroscopy for Elemental Analysis 171

6.1 Features of Characteristic X-rays 171

6.2 X-ray Fluorescence Spectrometry 176

6.3 Energy Dispersive Spectroscopy in Electron Microscopes 186

6.4 Qualitative and Quantitative Analysis 189

7 Electron Spectroscopy for Surface Analysis 197

7.1 Basic Principles 197

7.2 Instrumentation 201

7.3 Characteristics of Electron Spectra 206

7.4 Qualitative and Quantitative Analysis 209

8 Secondary Ion Mass Spectrometry for Surface Analysis 225

8.1 Basic Principles 226

8.2 Instrumentation 230

8.3 Surface Structure Analysis 237

8.4 SIMS Imaging 244

8.5 SIMS Depth Profiling 245

9 Vibrational Spectroscopy for Molecular Analysis 253

9.1 Theoretical Background 253

9.2 Fourier Transform Infrared Spectroscopy 267

9.3 Raman Microscopy 279

9.4 Interpretation of Vibrational Spectra 290

10Thermal Analysis 301

10.1 Common Characteristics 301

10.2 Differential Thermal Analysis and Differential Scanning Calorimetry 305

10.3 Thermogravimetry 319

Index 333

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