MEMS and Nanotechnology, Volume 5: Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics

by Barton C. Prorok (Editor), LaVern Starman (Editor)

Overview

The 16th International Symposium on MEMS and Nanotechnology, Volume 5 of the Proceedings of the 2015SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the fifth volume of nine from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of areas, including:
Microscale and Microstructural Effects on Mechanical Behavior
Dynamic Micro/Nanomechanics
In-situ Techniques
Mechanics of Graphene
Indentation and Small Scale Testing
MEMS.

Product Details

ISBN-13:	9781040602195
Publisher:	River Publishers
Publication date:	08/07/2025
Sold by:	Barnes & Noble
Format:	eBook
Pages:	112
File size:	12 MB
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About the Author

Barton C. Prorok, Auburn University, Auburn, USA. LaVern Starman, Air Force Research Laboratory, Wright-Patterson AFB, USA.

Table of Contents

1 Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces 2 In Situ TEM Nanomechanical Testing .3 Poisson’s Ratio as a Damage Index Sensed by Dual-Embedded Fiber Bragg Grating Sensor 4 In Situ High-Rate Mechanical Testing in the Dynamic Transmission Electron Microscope 5 In Situ TEM Observation of Twinning, Detwinning and Retwinning in Quartz 6 Nano to Macro: Mechanical Evaluation of Macroscopically Long Individual Nanofibers 7 Evaluating Pile-Up and Sink-In During Nanoindentation of Thin Films 8 Tapered Cantilevered Bimorphs for Piezoelectric Energy Harvesting: Characterization with Impedance Spectroscopy 9 Time and Temperature Dependence of Stress Relaxation in Al and Al Alloy Thin Films Application for MEMS 10 Detecting Interconnect Damage in Shock Using Acoustic Emission Detection 11 Application of Nanoindentation and Microdiffraction to Study Aging Effects in Lead Free Solder Interconnects 12 High Rate Experimental Test Method for Harsh Environment Stretchable Electronics 13 Measurement of the Electromechanical Response of Capacitors in Dynamic Loading Conditions.