Microelectronics Manufacturing Diagnostics Handbook

Overview

This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield.

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Paperback (Softcover reprint of the original 1st ed. 1993)
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Overview

This exhaustive new handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyroocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield.

Read More Show Less

Editorial Reviews

Booknews
Contributors (all but one work for IBM) describe methods of defect reduction--the vital process of reducing cost and improving reliability--developed in the microelectronics world, but applicable to any manufacturing process of similar complexity. Discussion encompasses measurement systems, manufacturing control techniques, testing, diagnostics, failure analysis, and modeling--all in the interests of preventing, reducing, or quickly determining defects. Several sections are devoted exclusively to solving non-semiconductor manufacturing problems. Annotation c. Book News, Inc., Portland, OR (booknews.com)
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Product Details

  • ISBN-13: 9781461358404
  • Publisher: Springer US
  • Publication date: 4/30/2013
  • Edition description: Softcover reprint of the original 1st ed. 1993
  • Edition number: 1
  • Pages: 633
  • Product dimensions: 7.00 (w) x 10.00 (h) x 1.35 (d)

Table of Contents

Foreword; Preface; Author's biographies; Acknowledgments; Introduction; Manufacturing yield; Problem diagnosis; Manufacturing defect classification system; Product dimensional metrology and pattern defect inspection; Process and tool monitoring; Contamination monitoring; Repair and rework; Test sites and vehicles for yield and process monitoring; In-line electrical test; Traceability; Failure analysis of semiconductor devices; Materials and chemical analysis of electronic devices; Modeling for manufacturing diagnostics; Artificial intelligence techniques for analysis: expert systems and neural networks; Statistical quality control; Reliability/defect severity; Burn-in; Defect prevention; Index

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