Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983

by A.G. Cullis

Overview

This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Product Details

ISBN-13:	9780854981588
Publisher:	Taylor & Francis
Publication date:	01/01/1983
Series:	Institute of Physics Conference Ser. , #67
Pages:	300
Product dimensions:	6.12(w) x 9.19(h) x (d)

About the Author

A. G. Cullis (Author) , S. M. Davidson (Edited by) , G. R. Booker (Edited by)

Table of Contents

Section 1 Structure and properties of dislocations, Section 2 High resolution microscopy, Section 3 Transient annealing phenomena, Section 4 Silicon characterisation, Section 5 Compund semiconductor characterization, Section 6 Scanning EBIC and CL, Section 7 X-ray techniques, Section 8 Non-conventional microscopy, Section 9 Device assement by scanning microscopy, Section 10 Device assessment by transmisison microscopy.