This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. Readers will learn that these objects are used not only to enhance the throughput of optical communications (backbone of the internet network), but also to for smart-sensing, metrology, quantum application and artificial intelligence. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book.
This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. Readers will learn that these objects are used not only to enhance the throughput of optical communications (backbone of the internet network), but also to for smart-sensing, metrology, quantum application and artificial intelligence. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book.
Mixed-Signal Generic Testing in Photonic Integration
Mixed-Signal Generic Testing in Photonic Integration
Related collections and offers
Product Details
| ISBN-13: | 9783031608117 |
|---|---|
| Publisher: | Springer-Verlag New York, LLC |
| Publication date: | 07/31/2024 |
| Series: | Synthesis Lectures on Digital Circuits & Systems |
| Sold by: | Barnes & Noble |
| Format: | eBook |
| File size: | 39 MB |
| Note: | This product may take a few minutes to download. |