Modeling and Characterization of RF and Microwave Power FETs

by Peter Aaen, Jaime A. Plá, John Wood

Overview

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

Product Details

ISBN-13:	9780521336178
Publisher:	Cambridge University Press
Publication date:	06/30/2011
Series:	The Cambridge RF and Microwave Engineering Series
Pages:	380
Product dimensions:	6.70(w) x 9.60(h) x 0.90(d)

About the Author

Peter H. Aaen is the Modeling Group Manager in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona.

Jaime A. Piá is the Design Organization Manager in the RF Division at Freescale in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona.

John Wood is Senior Technical Contributor responsible for RF CAD and Modeling in the RF Division at Freescale Semiconductor, Inc., Tempe, Arizona. He is a Fellow of the IEEE.

Table of Contents

1. RF and microwave power transistors; 2. An introduction to the compact modeling of high power FETs; 3. Electrical measurement techniques; 4. Passive components: simulation and modeling; 5. Thermal characterization and modeling; 6. Modeling the active transistor; 7. Function approximation for compact modeling; 8. Model implementation in CAD tools; 9. Model validation; About the authors; Index.

Editorial Reviews

"Truly useful...a well-written and...coherent review of the advanced state of power FET modeling and characterization"
IEEE Microwave Magazine, June 2008

From the Publisher