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New Trends and Potentialities of ToF-SIMS in Surface Studies
     

New Trends and Potentialities of ToF-SIMS in Surface Studies

by Jacek Grams
 
This new book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.

Overview

This new book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.

Product Details

ISBN-13:
9781600216350
Publisher:
Nova Science Publishers, Incorporated
Publication date:
05/28/2007
Pages:
273
Product dimensions:
7.30(w) x 10.30(h) x 0.90(d)

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