New Trends and Potentialities of ToF-SIMS in Surface Studiesby Jacek Grams
This new book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.
- Nova Science Publishers, Incorporated
- Publication date:
- Product dimensions:
- 7.30(w) x 10.30(h) x 0.90(d)
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