On-Line Testing for VLSI / Edition 1by Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function… See more details below
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Table of Contents
|On-Line Testing for VLSI - A Compendium of Approaches||7|
|On-Line Fault Monitoring||21|
|Efficient Totally Self-Checking Shifter Design||29|
|A New Design Method for Self-Checking Unidirectional Combinational Circuits||41|
|Concurrent Delay Testing in Totally Self-Checking Systems||55|
|Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters||63|
|Self-Testing Embedded Two-Rail Checkers||69|
|Thermal Monitoring of Self-Checking Systems||81|
|Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronics Structures||93|
|Clocked Dosimeter Compatible with Digital CMOS Technology||101|
|Scalable Test Generators for High-Speed Datapath Circuits||111|
|Mixed-Mode BIST Using Embedded Processors||127|
|A BIST Scheme for Non-Volatile Memories||139|
|On-Line Fault Resilience Through Gracefully Degradable ASICs||145|
|Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components||153|
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