On-Line Testing for VLSI / Edition 1

On-Line Testing for VLSI / Edition 1

by Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan
     
 

ISBN-10: 0792381327

ISBN-13: 9780792381327

Pub. Date: 04/30/1998

Publisher: Springer US

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function

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Overview

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

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Product Details

ISBN-13:
9780792381327
Publisher:
Springer US
Publication date:
04/30/1998
Series:
Frontiers in Electronic Testing Series, #11
Edition description:
Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998
Pages:
160
Product dimensions:
10.00(w) x 7.00(h) x 0.44(d)

Table of Contents

Foreword5
On-Line Testing for VLSI - A Compendium of Approaches7
On-Line Fault Monitoring21
Efficient Totally Self-Checking Shifter Design29
A New Design Method for Self-Checking Unidirectional Combinational Circuits41
Concurrent Delay Testing in Totally Self-Checking Systems55
Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters63
Self-Testing Embedded Two-Rail Checkers69
Thermal Monitoring of Self-Checking Systems81
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronics Structures93
Clocked Dosimeter Compatible with Digital CMOS Technology101
Scalable Test Generators for High-Speed Datapath Circuits111
Mixed-Mode BIST Using Embedded Processors127
A BIST Scheme for Non-Volatile Memories139
On-Line Fault Resilience Through Gracefully Degradable ASICs145
Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components153
Index161

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